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Scanning Electron Microscopy Scanning Electron Microscopy

  • Field Emission Scanning Electron Microscopy (FE-SEM)

    Field Emission Scanning Electron Microscopy (FE-SEM)

    The resolution and imaging quality are equal to traditional field emission scanning electron microscope’s.

    Optimized framework, core components in wafer size presents images at high resolution under the low voltage condition.

    Capable of low voltage and charge elimination; no need for coated sample ( directly view the nonconducting sample without metal or carbon spraying)

    Programmed XYZ stage in favor of user’s fine adjustment, scanning and information storage, simple and fast operation.

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400-615-4535
400-615-4535