Scanning Electron Microscopy Scanning Electron Microscopy

The resolution and imaging quality are equal to traditional field emission scanning electron microscope’s.

Optimized framework, core components in wafer size presents images at high resolution under the low voltage condition.

Capable of low voltage and charge elimination; no need for sample coating (directly view the nonconducting sample without metal or carbon spraying)

Programmed XYZ stage in favor of user’s fine adjustment, scanning and information storage, simple and fast operation.

The design of electrostatic lens ensures good repeatability, eliminates hysteresis and avoids repeated adjustments.

The compact machine body is easy to be installed without special space, cooling water and vibration isolation.

Easy for service, no need for frequent exchange of emission source.