- Description
- Etching Sample
- Consultation
ICP-RIE SI 500
Low damage etching
Due to low ion energy and narrow ion energy distribution, low damage etching and nano structuring can be performed with our icp plasma etching tools.
Simple high rate etching
High rate plasma etching of Si for MEMS with high aspect ratio is easily performed either using room temperature alternating processes or cryogenic processes for smooth side walls.
Inhouse ICP plasma source
The Planar Triple Spiral Antenna (PTSA) source is a unique feature of SENTECH high end plasma process systems. The PTSA source generates homogeneous plasma with high ion density and low ion energy. It features high coupling efficiency and very good ignition behavior for processing of a large variety of materials and structures.
Dynamic temperature control
Substrate temperature setting and stability during the plasma etching processes are demanding criteria for high quality etching. The ICP substrate electrode with dynamic temperature control in combination with He backside cooling and substrate backside temperature sensing provides excellent process conditions over a wide temperature range from -150 °C up to +400 °C.
SENTECH offers different levels of automation ranging from vacuum cassette loading to one process chamber up to six port cluster with different etch and deposition modules targeted to high flexibility or high throughput. The SI 500 ICP for plasma etching is available as process module on cluster configuration as well.
SI 500
ICP plasma etching tool
With vacuum loadlock
For up to 200 mm wafers
Substrate temperature from -20℃ to 300℃
SI 500C
Cryogenic ICP plasma etching system
With transfer chamber and vacuum loadlock
Substrate temperature from -150 ℃ to 400 ℃
SI 500-RIE
RIE plasma etching system
Smart solution for He backside cooled etching
Capacitive coupled plasma source,
upgradable to ICP plasma source PTSA 200
SI 500-300
ICP plasma etching system
With vacuum loadlock
For 300 mm wafers